Figure1

Introduction to electron ptychography for materials scientists

Figure 1. Different imaging methods of STEM and the corresponding detector settings. Typically, N ≥ 128[19].

Microstructures
ISSN 2770-2995 (Online)

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/