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![Scanning transmission electron microscopy for advanced characterization of ferroic materials](https://image.oaes.cc/b2f47884-6d9e-45b5-9c84-9fde798a056a/microstructures3039.fig.3.jpg)
Figure 3. (A) Atomic resolution images of SrTiO3 viewed along the [001] direction with ABF (11-22 mrad), BF (0-22 mrad), and ADF (90-170 mrad) STEM images. Adapted with permission[33]. Copyright © 2012 Elsevier. (B) DPC detector configuration with accompanying A-C and B-D STEM images of the ferroelectric Pb(Zr0.2Ti0.8)O3 thin films. Contrast resulting from the ferroelectric domain structures in Pb(Zr0.2Ti0.8)O3 are visible. Reprinted with permission[34] Copyright © 2021 MDPI. (C) Atomic resolution iDPC images of gallium nitride (GaN) oriented along the [11