fig3

Figure 3. (A) Schematic of the lateral bending test of a fixed wire with an AFM tip. Reproduced with permission^[34]. Copyright 2005, Springer Nature. (B) Low magnification TEM images of the experimental setup. The spring constant of the AFM cantilever is 0.02 nN/nm. Reproduced with permission^[46]. Copyright 2021, Springer Nature. (C) The TEM holder with self-sensing AFM tips. Reproduced with permission^[62]. Copyright 2008, IEEE publications. (D) Left: Optical microscopy image of the used QTF. Right: Function between the driving frequency f and the amplitude of the current I_TF flowing through a QTF driven by a sinusoidal voltage with amplitude V_in = 10 mV. Inset shows the equivalent circuit diagram of a piezoelectrical resonator. Reproduced with permission^[52]. Copyright 2015, Elsevier. (E) Photograph of a Q-Plus sensor - a cantilever made from a QTF. Reproduced with permission^[65]. Copyright 2020, American Physical Society publications. (F) Photographs showing the self-developed TEM holder and an illustration of the measurement system. Inset shows the sample stage at the head of this holder. Reproduced with permission^[66]. Copyright 2020, IOP publications.