fig1

Deformation behavior of hard ceramic layer coated Ti composite: <i>in situ</i> characterization and molecular dynamics simulation

Figure 1. (A) The size of the improved corresponding bracket for model 654 single tilt straining holder; (B-D) the FIB processing process of the improved “V-type” notch bracket. FIB: Focused ion beam.

Microstructures
ISSN 2770-2995 (Online)

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Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/