fig11

Figure 11. Hierarchically heterogeneous structures created by LAM and LST techniques: (A) SEM image showing the morphology along the depth direction of the LSR-TiZrHfTaNb_0.5; (B) Variations of grain size and microhardness along the depth away from the topmost surface; TEM characterization of crystalline-amorphous nanostructured surface layer (C and D) and at a depth of 10-20 µm (E and F); 20-40 µm (G and H) and 40-60 µm (I and J) below the surface^[101]. (K) IPF map of building plane of the SLM-Fe₆₀Co₁₅Ni₁₅Cr₁₀; (L) The pseudo-3D EBSD KAM maps; (M) SEM. (N) STEM image of solidification cells; (O) XRD pattern with inset showing EBSD phase maps on the plane normal to the scan direction; (P) 3D reconstructed element distributions near the cell boundaries by APT analysis; (Q) 1D concentration profiles of the 3D element distribution in the APT maps^[102].