fig6

Figure 6. (A) Schematic of the lift-out of a buried thin film; (B) Schematic of the attachment of a rotated lift-out bar with a horizontal pre-sharpened post; (C) SEM image of (B) in the noted viewing direction before attachment; (D) SEM image showing the attachment of a sample bar onto a rotated pre-sharpened post; (E) SEM image of a sample bar incorporating the thin film sample and the Pt deposition. SEM: Scanning electron microscope.