fig2

Improved atom probe specimen preparation by focused ion beam with the aid of multi-dimensional specimen control

Figure 2. (A) Schematic illustration of lifting out a bar with encapsulated NPs; (B) Electron imaging and Ion imaging of lifted-out bar before rotating the manipulator; (C) schematic illustration showing the lifted-out wedge after 180° rotation of the manipulator; (D) Electron and Ion imaging of the lifted-out bar after rotating the manipulator for 180° and the alignment between the bar and the pre-sharpened tungsten post for attaching. NPs: Nanoparticles.

Microstructures
ISSN 2770-2995 (Online)

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/