fig1

Improved atom probe specimen preparation by focused ion beam with the aid of multi-dimensional specimen control

Figure 1. Schematic illustrations of how to change the orientation of lifted-out bar using the rotatable manipulator fitted in PFIB. The relative orientations of manipulator and the lifted-out bar (A) before and (B) after rotation. PFIB: Plasma focused ion beam.

Microstructures
ISSN 2770-2995 (Online)

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Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/