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fig1

From:  Defect-induced interfacial modulation for enhanced resistive switching performance in antiferroelectric/ferroelectric heterostructures
Defect-induced interfacial modulation for enhanced resistive switching performance in antiferroelectric/ferroelectric heterostructures

Figure 1. Crystal structure characterization of epitaxial NNO and (NNO/PTO)3 thin films. Out-of-plane XRD θ-2θ scans of NNO thin films (A) and (NNO/PTO)3. (B) grown on (001) Nb-STO substrates. (C) Low-magnification HAADF-STEM image of the (NNO/PTO)3 film grown on Nb-STO substrates and EDS mapping of the (NNO/PTO)3/Nb-STO heterointerface.

Microstructures
ISSN 2770-2995 (Online)
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