fig1
Figure 1. Microstructure and surface morphology of BNST-xFN ceramic samples after thermal etching. (A) X-ray diffraction (XRD) patterns of BNST-xFN ceramics, with red pentagrams indicating the peaks corresponding to the impurity phase. (B) Enlarged view of the (111) diffraction peak. (C) Magnified image of the (200) diffraction peak. (D) Raman spectra of BNST-xFN ceramic samples, along with the results of fitting thirteen Gaussian-Lorentzian peaks. (E) Variation of the Gaussian-Lorentzian peak positions across the thirteen peaks. (F1-F4) Surface morphology maps of BNST-xFN ceramics after thermal etching: (F1) x = 0, (F2) x = 0.01,
