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fig3

From:  Coexistence of ferroelectric and ferrielectric phases in ultrathin antiferroelectric PbZrO3 thin films
Coexistence of ferroelectric and ferrielectric phases in ultrathin antiferroelectric PbZrO<sub>3</sub> thin films

Figure 3. (A) XRD θ - 2θ profiles around STO (002) diffraction obtained from a 12 nm PZO thin film that was grown on SRO (about 28 nm) buffered STO (001) substrate. (B) An AFM topographic image showing the surface roughness of the PZO thin film. (C) A TEM bright field image showing the cross-section of the PZO thin film.

Microstructures
ISSN 2770-2995 (Online)
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