fig15
![Reduced dimensional ferroelectric domains and their characterization techniques](https://image.oaes.cc/3d89e922-f702-431e-8c5c-17c2e1dcce51/microstructures3067.fig.15.jpg)
Figure 15. Four different STEM imaging modes. (A) STEM images of the LaAlO3 with intensity profiles. Reproduced with permission[197]. Copyright 2013, Elsevier B.V. (B) Comparison between ABF- and eABF-STEM images of CaTiO3 thin film.
Figure 15. Four different STEM imaging modes. (A) STEM images of the LaAlO3 with intensity profiles. Reproduced with permission[197]. Copyright 2013, Elsevier B.V. (B) Comparison between ABF- and eABF-STEM images of CaTiO3 thin film.
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