fig2

Figure 2. (A) A schematic of the 2D nucleation and layer-by-layer (Frank-Van der Merwe) growth mode. (B) Representative HR-TEM images demonstrating the presence of 2D islands and pits in the 7.9 nm thick B6TFMO film on NGO (001). (C) Representative AFM image of 5.6 nm thick B6TFMO film NGO (001) substrates. A line section profile 1 is shown in white through the 2D pits indicating a height of 2.5 nm, corresponding to half a u.c. (c/2) of the m = 5 Aurivillius structure (see Figure 1A). Small circular island-type inclusions (< 20 nm diameter) are encircled in red. (D) Lateral (Lat) PFM Amp and Phase images of the pristine surface of a 7.9 nm thick B6TFMO film.