fig2

Figure 2. (A) HAADF-STEM (a) and LAADF-STEM (b and c) of a low-angle twist grain boundary between SrTiO₃ and Nb: SrTiO₃, demonstrating the effect of crystal orientation and strain fields for the respective imaging conditions. Reprinted with permission^[25]. Copyright © 2007 Elsevier. (B) HAADF-STEM images of NaLaMgWO₆ ceramics taken along the [111], [110], and [100] zone axes (a-c) confirmed by STEM image simulations for each zone (d-f). Chemical order further confirmed by atomic resolution EDS mapping (g-i). Reprinted with permission^[26]. Copyright © 2022 Elsevier. (C) Polarization map superimposed on HAADF-STEM image of Ca-doped BiFeO₃ thin films. Profiles of in-plane and out-of-plane displacement components are also displayed. Reprinted with permission^[27]. Copyright © 2018 American Chemical Society.