fig1

Scanning transmission electron microscopy for advanced characterization of ferroic materials

Figure 1. Schematic overview of (A) (HR)TEM, (B) STEM, and (C) 4D-STEM in electron microscopes.

Microstructures
ISSN 2770-2995 (Online)

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Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/