fig1

Figure 1. XRD θ-2θ scan patterns of the thin film heterostructures of (A) BaTiO3/Pt/Ti/Si (with various thicknesses of the BaTiO3 layer) and (B) BaTiO3/LaNiO3/Pt/Ti/Si (with a 510 nm thick BaTiO3 layer).
Figure 1. XRD θ-2θ scan patterns of the thin film heterostructures of (A) BaTiO3/Pt/Ti/Si (with various thicknesses of the BaTiO3 layer) and (B) BaTiO3/LaNiO3/Pt/Ti/Si (with a 510 nm thick BaTiO3 layer).
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