fig8

Figure 8. (A) Top: Sequential TEM images of a GaAs nanowire during in-situ compression tests. Bottom: Relationships between failure strain, Young’s modulus and mean diameter of GaAs nanowires obtained from finite element analysis (FEA) results based on experimental data and FEA models corresponding to the states in TEM images (A1-A3), respectively. Reproduced with permission^[81]. Copyright 2011, Wiley-VCH GmbH. (B) The TEM image and size-dependent Young’s modulus of the Au nanocontacts. Reproduced with permission^[22]. Copyright 2022, American Physical Society publications.