fig4

<i>In-situ</i> transmission electron microscopy shedding light on the mechanical properties of nanoscale materials

Figure 4. (A) Schematic of in-situ atomic-scale tensile testing of a nanoporous gold film using a home-built TEM strain actuator. Reproduced with permission[48]. Copyright 2019, Elsevier. (B) Left side: A schematic view shows that the scattered Ni nanowires on a TEM grid covered by previously fractured colloidal thin film. Right side: Low magnification and enlarged (red framed region) TEM images show the deformation process of a single Ni nanowire by tensile stress induced by the under electron-beam irradiation. Reproduced with permission[42]. Copyright 2013, Springer Nature. (C) Experimental setup with a TEM grid, where a dog-bone-shaped Al thin film was held on a MEMS. Reproduced with permission[69]. Copyright 2015, Elsevier. (D) Diagram of the stretching TEM holder and the optical image of MoS2 layers across the trench of the Si/Si3N4 substrate. Reproduced with permission[70]. Copyright 2022, Elsevier.

Microstructures
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