fig2

Figure 2. (A) The working principle of STM. Reproduced with permission^[55]. Copyright 2004, Elsevier. (B) Schematic illustration of the side-entry holder and its STM head with a three-dimensional coarse motion mechanism. The inset shows the in-situ selectively approaching process of a gold tip to a carbon nanotube with 20 nm in diameter. Reproduced with permission^[56]. Copyright 2003, AIP publications. (C) Top view of an optical image of a two-probe STM holder consisting of chromel and constantan piezo-driven probes and a thinned TEM specimen supported on a tungsten base. Reproduced with permission^[57]. Copyright 2018, Elsevier. (D and E) Photograph of the new STM holder designed for UHVTEM (JEM-2000VF) and the electronic circuit used for the conductance measurement. Reproduced with permission^[58]. Copyright 2003, Elsevier. (F) Photographs and schematics showing the design of the double-tilt in-situ TEM holder. Reproduced with permission^[60]. Copyright 2018, Elsevier.