fig11
Figure 11. (A) In-situ SEM bending test and time evolution for anelastic of ZnO nanowires. Reproduced with permission[54]. Copyright 2015, Springer Nature. (B) TEM micrographs showing the mechanical response of a GaAs nanowire with a high density of stacking faults. Reproduced with permission[96]. Copyright 2013, ACS publications.
