fig11

<i>In-situ</i> transmission electron microscopy shedding light on the mechanical properties of nanoscale materials

Figure 11. (A) In-situ SEM bending test and time evolution for anelastic of ZnO nanowires. Reproduced with permission[54]. Copyright 2015, Springer Nature. (B) TEM micrographs showing the mechanical response of a GaAs nanowire with a high density of stacking faults. Reproduced with permission[96]. Copyright 2013, ACS publications.

Microstructures
ISSN 2770-2995 (Online)

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