fig5
Figure 5. (A) IL-SEM image, (B) HRTEM image and (C) EDS line scan profiles of pristine NiFe nanoparticles. (D) IL-SEM image, (E) HRTEM image and (F) EDS line scan profiles of NiFe nanoparticles after electrochemical test[68]. IL-SEM: Identical location scanning electron microscopy; EDS: energy-dispersive X-ray spectroscopy.
