fig7

Figure 7. EBSD-based orientation map and corresponding energy dispersive X-ray spectroscopy (EDS) maps of Ni, Ti, Fe, Cr and V elements were collected from the cross-sectional sample in Area 3, as indicated in Figure 1. The thicker lines in the maps show the large-angle grain boundaries (misorientation angles > 7°), and fine lines represent small-angle grain boundaries (misorientation angles 0.15°-7°). The intensities of EDS maps are normalized to the same color scale. EBSD: Electron backscatter diffraction.