fig10

Figure 10. Energy dispersive X-ray spectroscopy (EDS) line scanning on the cross-section across the dendritic microstructure, showing the compositional variation as a function of the distance from the sample top. The errors of the EDS data for the measured elements (Fe, Cr, V, Ti and Ni) are estimated to be within ±1 at.% based on the counting statistics of X-ray spectra in the EDS measurements. To follow the correlation between the composition and microhardness, the microhardness data in Figure 7A is also included.