fig17
Figure 17. SEM images of deformed samples under different conditions: (A) 473 K/10-1; (B) 473 K/10-2; (C) 473 K/10-3; (D) 573 K/10-1; (E) 573 K/10-2; (F) 573 K/10-3; (G) 673 K/10-1; (H) 673 K/10-2; (I) 673 K/10-3. SEM: Scanning electron microscopy.
