fig4

Figure 4. (A) Low-resolution TEM image of Sb₂Te₃ f-TF prepared at T_diff = 623 K; (B) High-resolution TEM image taken from the yellow square in Figure 4A; (C) The enlarged TEM images of the yellow square in Figure 4B; (D) The corresponding lattice strains of Figure 4C along different directions; (E) The TEM-EDS maps of Sb and Te; (F) The corresponding TEM-EDS spectrum. EDS: Energy dispersive X-ray spectroscopy; f-TFs: flexible thin films; TEM: transmission electron microscopy.