fig3
![A facile <i>in-situ</i> reaction method for preparing flexible Sb<sub>2</sub>Te<sub>3</sub> thermoelectric thin films](https://image.oaes.cc/cd2423bf-3962-4e75-8469-f97a323e400e/ss3034.fig.3.jpg)
Figure 3. (A) SEM morphology of Sb2Te3 f-TFs prepared at Tdiff = 603, 623, and 643 K, respectively; (B) EDS spectrum and atomic content of Sb2Te3 f-TFs prepared at Tdiff = 623 K; (C) The corresponding SEM-BSE images and EDS maps; (D) The measured atomic contents of Sb2Te3 f-TFs. BSE: Backscattered electron; EDS: energy dispersive X-ray spectroscopy; f-TFs: flexible thin films; SEM: scanning electron microscopy.