fig3
Figure 3. (A) SEM morphology of Sb2Te3 f-TFs prepared at Tdiff = 603, 623, and 643 K, respectively; (B) EDS spectrum and atomic content of Sb2Te3 f-TFs prepared at Tdiff = 623 K; (C) The corresponding SEM-BSE images and EDS maps; (D) The measured atomic contents of Sb2Te3 f-TFs. BSE: Backscattered electron; EDS: energy dispersive X-ray spectroscopy; f-TFs: flexible thin films; SEM: scanning electron microscopy.
