fig5
Figure 5. XRD patterns obtained at different heights across the ICTE in the NiFe/Mg3+δBi1.5Sb0.5 sample. (A) Schematic illustration of the data collection showing that, after the initial XRD pattern was obtained, further data were collected after each polishing to remove layers with thicknesses t1, t2, and t3, as specified in (B and C). XRD patterns obtained across the ICTE (B) prior to and (C) after aging. The dashed blue, dark cyan, magenta, and red lines in (A) indicate the XRD collecting surfaces corresponding to the XRD patterns in (B and C).
