fig4
![What lies beneath? Investigations of atomic force microscopy-based nano-machining to reveal sub-surface ferroelectric domain configurations in ultrathin films](https://image.oaes.cc/c2d32a2d-f934-45bd-8061-57b812fb4f71/microstructures3041.fig.4.jpg)
Figure 4. Representative topography and lateral (lat) DART-PFM phase and amplitude (amp) images of 5.6 nm (1 u.c.) B6TFMO on NGO (001) as a function of AFM-based nano-machined depth. The scanning direction of the cantilever scanning direction was parallel with the [100]substrate axis.