fig1

Figure 1. (A) Schematic of an m = 5 Aurivillius phase crystal structure (space group B2eb) projected down the orientation^[43,59]. Half a u.c. (c/2) consists of five perovskite blocks between fluorite-type bismuth oxide layers. (B) Representative XRD patterns of 7.9 nm and 5.6 nm B6TFMO films on NGO (001). (C) Representative HR-TEM image demonstrating 7.9 nm thick B6TFMO films on NGO (001) substrates. (D) XRR plot used to extract the thickness value of the 5.6 nm B6TFMO film on NGO (001).