fig4

Scanning transmission electron microscopy for advanced characterization of ferroic materials

Figure 4. (A) Analyzing atom column positions to find the projected pair distribution functions of the A and B sublattices. Adapted with permission[87]. Copyright © 2015 AIP Publishing. (B) Utilizing Atomap to find the displacement of oxygen columns in the [001] direction from an ABF-STEM image. Adapted with permission[82]. Copyright © 2017 Springer. (C) Various polarization plots at domain walls for Bi6TixFeyMnzO16 multiferroic thin films created with TopoTEM. Numerous plotting features, including angle-dependent vector colors, area-averaged polarization, and contour plots, are illustrated to highlight domain walls. Reprinted with permission[95]. Copyright © 2022 American Chemical Society.

Microstructures
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