fig4
![Crystallographic variant mapping using precession electron diffraction data](https://image.oaes.cc/d5496336-a6da-4c4d-8e56-b93eb7fdbc48/202317.fig.4.jpg)
Figure 4. VBF image of VO2 thin film on sapphire (left) and the selected diffraction patterns (right) for similarity quantification.
Figure 4. VBF image of VO2 thin film on sapphire (left) and the selected diffraction patterns (right) for similarity quantification.
All published articles are preserved here permanently:
https://www.portico.org/publishers/oae/