fig1
![Crystallographic variant mapping using precession electron diffraction data](https://image.oaes.cc/d5496336-a6da-4c4d-8e56-b93eb7fdbc48/202317.fig.1.jpg)
Figure 1. (A) VBF, (B) index, (C) reliability, and (D) orientation maps of the SMA sample. (E) VBF, (F) index, (G) reliability, and (H) orientation maps of the VO2 on sapphire sample. Note the reliability and orientation maps are noisy in both samples.