fig5

Interpretable model of dielectric constant for rational design of microwave dielectric materials: a machine learning study

Figure 5. ML results of εr for quaternary materials. (A) RF ranking of the importance of material features for εr in the quaternary material dataset; (B) The variation of R2 and RMSE (in the black bracket) as a function of SISSO iterations; (C) Scatter plot of the predicted dielectric constant versus experiment reports after four iterations. ML: Machine learning; RF: random forest; R2: coefficient of determination; RMSE: root-mean-square error; SISSO: sure independence screening and sparsifying operator.

Journal of Materials Informatics
ISSN 2770-372X (Online)
Follow Us

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/