fig4

Automated production of batched unclonable micro-patterns anti-counterfeiting labels with strong robustness and rapid recognition speed

Figure 4. (A) Examples after rotation angle and brightness adjustments (under a fluorescent microscope) and (B) histogram of corresponding brightness (V). The three lines represent the pixel distribution for each brightness value in the three images from (A), with each y-value corresponding to the number of pixels with a specific brightness value in the image.

Journal of Materials Informatics
ISSN 2770-372X (Online)
Follow Us

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/

Portico

All published articles are preserved here permanently:

https://www.portico.org/publishers/oae/