fig11
Figure 11. (A) XRD patterns (B) OM (C) SEM micrograph (D) EDS maps of the Al-2.64Si-0.43Mg-0.10Zn-0.03Cu alloy. XRD: X-ray diffraction; OM: optical micrograph; SEM: scanning electron microscopy; EDS: energy-dispersive X-ray spectroscopy.
Journal of Materials Informatics
ISSN 2770-372X (Online)
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