fig7
![Sulfur poisoning mechanism of LSCF cathode material in the presence of SO<sub>2</sub>: a computational and experimental study](https://image.oaes.cc/eb5e98f8-ad1b-47ce-b302-09a0d07771db/5486.fig.7.jpg)
Figure 7. TEM characterization of a Sulfur-rich region of the LSCF surface after treatment in Argon at 1,000 °C. (A) Dark field STEM image of S-rich surface nanocrystals. White circle marks the location of the SAD aperture used to acquire a diffraction pattern of the nanocrystal, and the cyan box marks the location of the STEM EDS elemental map (C-I); (B) TEM diffraction pattern of nanocrystal; d-spacing values match those of SrSO4 for d102, d210, and d401; (C-H) STEM-EDX elemental maps for Sr, S, La, Fe, Co, and O, displayed as relative atomic composition for each element; (I) combined elemental map for atomic fractions of Sr, S, La, Co, and Fe. ROI-7A, ROI-7B, and ROI-7C mark the regions where atomic composition was quantified using the STEM-EDS data, shown in Table 4.