fig2
Figure 2. AC-HAADF-STEM images of (A) 0.01% Ir/TiO2; (B) 0.05% Ir/TiO2 and HAADF-STEM images of (C) 0.2% Ir/TiO2; (D) 0.5% Ir/TiO2; (E) 1.0% Ir/TiO2 samples after reduction at 500 °C. AC-HAADF-STEM: Aberration-corrected high-angle annular dark-field scanning transmission electron microscopy.
