fig12

Figure 12. (A) Schematic illustration of the formation mechanism of W/UiO-66 nanocages; (B-D) TEM images of several W/UiO-66 nanocages observed from different directions^[97]. Copyright 2018, Royal Society of Chemistry; (E) Schematic illustration of direct patterning of MOF films by XRL and EBL; (F) SEM image of ZIF-71 film after XRL patterning; (G) SEM image of ZIF-71 films after EBL patterning^[98]. Copyright 2020, Springer Nature. Scale bars: (F) 20 μm and (G) 1 μm. TEM: Transmission electron microscopy; MOF: metal–organic framework; XRL: X-ray lithography; EBL: electron beam lithography; SEM: scanning electron microscopy; ZIF: zeolitic imidazolate framework.