fig2
Figure 2. (A, D, G) SEM images, (B, E, H) TEM images, [C(i), F(i), I(i)] Si EDS mapping and [C(ii), F(ii), I(ii)] Al or/and Ga EDS mapping of the (A-C) Z12, (D-F) [Ga,Al]Z12 and (G-I) GaZ12 samples. SEM: Scanning electron microscopy; TEM: transmission electron microscopy; EDS: energy dispersive X-ray spectrometry.
