fig1

Figure 1. Characterization of PDMS substrates through AFM Force Spectroscopy (A) and 3D optical profilometer system (B). The lower and upper boundaries of the box represent Q1 (25 percentile) and Q3 (75 percentile) of the data, respectively; the horizontal bar inside the box represents the median of the data. Significance of data differences was established via the Anova Kruskal-Wallis test (^*P < 0.05; ^**P < 0.01; ^***P < 0.001; ^****P < 0.0001, respectively). PDMS: Polydimethylsiloxane; AFM: atomic force microscopy; 3D: three-dimensional.