fig5

Figure 5. SEM images of a nano-Si agglomerate at magnifications 100,000x (A) and 200,000x (B) (Zeiss Leo 1530, 10 kV). SEM: scanning electron microscope.
Figure 5. SEM images of a nano-Si agglomerate at magnifications 100,000x (A) and 200,000x (B) (Zeiss Leo 1530, 10 kV). SEM: scanning electron microscope.
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