fig5

Figure 5. (A and B) Device stack structure of PSC used for N_o measurement in (C), (A) ITO-Glass/NiO_x/MAPbI₃/C₆₀/solvent or solvent-free C electrode, (B) ITO-Glass/NiO_x/MAPbI₃/C₆₀/Ag electrode, Arrows in (A and B) represent probe contact points while performing the measurement, (C) G_cvs. N_o of PSCs with C or Ag top electrodes showing lower N_o and higher G_c with Ag top electrode. Inset - Device stack structure (sandwich structure) used for G_c measurements - Glass/ITO/NiO_x/MAPbI₃/C₆₀/Ag or C electrode/epoxy/glass.